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搜索结果: 1-15 共查到会议中心 X-Ray相关记录20条 . 查询时间(0.125 秒)
Observation of the hot universe, from 105 K upward, has a vital impact on some of the most fundamental questions in astrophysics today. Hot plasmas, from the sun and stellar coronae to the cores of ga...
Expanding use of x-ray and EUV radiation in many scientific and technical applications requires the continued development of new and improved sources and optics to deliver brighter, better-conditioned...
Adaptive optics is a well-established technology, first developed for correcting wavefront errors due to atmospheric turbulence. Its applications are expanding into areas ranging from ophthalmology to...
Advances continue to be made in hard x-ray, gamma-ray, neutron detectors and associated technologies for spectroscopy and imaging of these energetic photons and particles. Many types of position and e...
It is a great pleasure and an honor to extend to you a warm invitation to attend the 35th International Cosmic Ray Conference 2017(ICRC2017) at the Busan Exhibition & Convention Center (BEXCO) in Busa...
2017SPIE EUV,X射线和伽玛射线天文学光学专题会议(Optics for EUV,X-Ray,and Gamma-Ray Astronomy VIII)。
2017SPIE紫外线,X射线和伽玛射线太空仪器专题会议(UV,X-Ray,and Gamma-Ray Space Instrumentation for Astronomy XX)。
2017SPIE硬X射线,伽玛射线和中子探测器物理专题会议(Hard X-Ray,Gamma-Ray,and Neutron Detector Physics XIX)。
2017SPIEX射线断层扫描的发展专题会议(Developments in X-Ray Tomography XI)。
2017SPIEX射线纳米成像专题会议(X-Ray Nanoimaging:Instruments and Methods III)。
2017SPIE实验室X射线源,光学和应用进展专题会议(Advances in Laboratory-based X-Ray Sources,Optics,and Applications VI)。
2017SPIEX射线/EUV光学器件进展专题会议(Advances in X-Ray/EUV Optics and Components XII)。
2017SPIEX射线和EUV光学计量学进展专题会议(Advances in Metrology for X-Ray and EUV Optics VII)。
Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
Conference Sessions:1: X-Ray Sources I ;2: X-Ray Sources II ;3: Optics and Applications I ;4: Optics and Applications II

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