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METRIC SURVEY AND BIM TECHNOLOGIES TO RECORD DECAY CONDITIONS
Metric survey H-BIM 3D decays Data enrichment Integrated workflow TLS
2017/6/20
The paper proposes a method able to describe, classify and organize information assets concerned with Architectural Heritage, through the use of integrated survey procedures, mainly based on Terrestri...
Design tools for emerging technologies
optimization simulation nanotechnology computeraided design
2015/8/10
The rapidly expanding diversity of technology available at the nanoscale is disrupting the existing transistor-centric microelectronics design paradigm, resulting in nearly decade-long delays between ...