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Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors
Hot-carrier P-MOS transistor lifetime prediction
2009/7/28
Along with advances in microelectronics, and computer and space technologies, device dimensions are becoming smaller; as a result, hot-carrier effect, lifetime prediction, and reliability become more ...
The Degradation of Epoxy Resin-Coated ZnO Varistors at Elevated Temperatures and Ambient Humidity Conditions
Zinc oxide (ZnO) ceramics Varistor Degradation Epoxy resin powder Ageing Insulating material
2010/12/7
The degradation of the epoxy resin-coated commercial ZnO varistors at elevated temperatures and ambient humid conditions has been investigated experimentally. It has been observed that the leakage cur...
Voltage Degradation Model of Thin Film Capacitors
Voltage Degradation Model Thin Film Capacitors
2010/12/23
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a f...
Aging Degradation of Ni and NiCr-Ni Thin Film Conductor Systems
an experimental procedure NiCr-Ni Thin Film Conductor Systems
2010/12/28
In this paper an experimental procedure for the evaluation of the Ni and NiCr-Ni new low cost conductor systems is described. The possibility of an application of these conductor systems as a contact ...